Introduction to the Scanning Electron Microscope (SEM)

Duke University - SMIF
13 Apr 202016:06

Summary

TLDRThis video provides an overview of Scanning Electron Microscopy (SEM) and Environmental Scanning Electron Microscopy (ESEM). It explains how SEM uses electrons instead of visible light to generate highly detailed images of samples, focusing on secondary and backscattered electrons. The script compares coated and uncoated samples, discusses issues like charging, and demonstrates the advantages of ESEM for imaging wet samples. Practical steps for sample preparation, imaging in different modes, and the differences between secondary electron and backscatter imaging are illustrated through a salt crystal experiment.

Takeaways

  • 🔬 SEM and ECM use electrons instead of visible light for imaging, providing higher resolution due to the shorter wavelength of electrons.
  • 💡 In a light microscope, glass lenses focus and detect light, whereas SEM uses an electron gun and electromagnetic lenses.
  • 📸 SEM images are usually formed by detecting secondary electrons, which show surface features and produce a 3D-like effect.
  • ⚡ Charging occurs in samples when the number of electrons hitting and leaving the sample is unequal, which can be prevented by coating with a thin layer of metal.
  • 📏 SEM can image features as small as 1-2 nanometers and as large as 1-2 millimeters, with scale bars indicating sizes in images.
  • 🎯 Backscatter electron images highlight differences in atomic number, with regions of higher atomic number appearing brighter.
  • 💧 Traditional SEM requires a vacuum and dry samples, while ECM allows for imaging of wet samples by introducing water vapor.
  • 🌿 ECM is particularly useful for imaging biological samples like cells and bacteria without distorting them by drying.
  • ⚙️ Conductive samples do not require coating in SEM, while non-conductive samples are often coated to prevent charging issues.
  • 🔄 SEM can operate in various modes, including high vacuum, low vacuum, and environmental SEM, offering flexibility for different sample types.

Q & A

  • What is the main difference between SEM and ECM?

    -The main difference between SEM (Scanning Electron Microscopy) and ECM (Environmental Scanning Electron Microscopy) is that SEM operates in a high vacuum, while ECM allows the introduction of water vapor into the vacuum chamber, making it suitable for imaging wet samples without drying them.

  • Why do electron microscopes use electrons instead of visible light?

    -Electron microscopes use electrons instead of visible light because electrons have a much shorter wavelength, allowing for higher resolution imaging that can visualize smaller features compared to traditional optical microscopes.

  • What is charging in the context of SEM, and why is it a problem?

    -Charging occurs when the number of electrons that strike the sample is not equal to the number of electrons that leave the sample. This causes a buildup of electrical charge, which negatively affects the quality of the image, often making it blurry or distorted.

  • How is charging prevented in SEM?

    -Charging is often prevented by coating non-conductive samples with a thin layer of metal, such as gold-palladium, to allow electrons to flow away from the sample, preventing charge buildup.

  • What are the two main types of electrons detected in SEM, and what information do they provide?

    -The two main types of electrons detected in SEM are secondary electrons and backscattered electrons. Secondary electrons provide information about the surface topology, offering 3D-like images, while backscattered electrons provide information on atomic number contrasts, often appearing flatter and showing brighter areas for materials with higher atomic numbers.

  • What advantages does ECM have over traditional SEM?

    -ECM allows for imaging wet or biological samples without needing to dry them out, preserving their natural state. It also helps prevent charging on non-conductive samples by introducing water vapor into the chamber.

  • Why is a vacuum necessary in SEM imaging?

    -A vacuum is necessary in SEM imaging because electrons used for imaging would scatter off gas molecules in the air, preventing the electron beam from being focused on the sample and resulting in poor image quality.

  • What is the purpose of the sputter coater in SEM sample preparation?

    -The sputter coater deposits a thin layer of conductive material, such as gold-palladium, onto non-conductive samples to prevent charging during SEM imaging, ensuring high-quality images.

  • What kind of samples benefit from being imaged in ECM mode?

    -Biological and wet samples, such as cells, bacteria, and plant tissues, benefit from being imaged in ECM mode, as they can remain hydrated and be imaged in their natural state without drying or coating.

  • What difference is seen between secondary electron and backscattered electron images?

    -Secondary electron images highlight the surface features of a sample, creating a more 3D appearance. Backscattered electron images emphasize atomic number contrasts, with regions of higher atomic numbers appearing brighter, and the images generally looking flatter.

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Связанные теги
Electron MicroscopySEM ImagingECM TechniquesNanotechnologyMaterial ScienceMicroscopy LabHigh Vacuum ModeBiological SamplesSample PreparationSurface Topology
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