MICRONAS - Micronas Backend Overview

Symmetry Electronics
8 Aug 201213:21

Summary

TLDRThe video script details the backend production process at Micronus, focusing on the meticulous testing and assembly of integrated circuits. It showcases the use of special equipment for parameter testing, probe cards for individual die testing, and the precise placement of components. The process includes dicing silicon wafers, bonding dice onto lead frames, and wire bonding. Quality control measures such as mechanical tests and statistical process control ensure reliability. The components are then molded, trimmed, and inspected, with final checks at extreme temperatures to simulate real-world applications. Each component is marked with a laser for identification, ensuring high-quality standards from Micronus.

Takeaways

  • πŸ“¦ Silicon wafers are transported in dust-type boxes from the wafer fabrication facility to the backend production area.
  • πŸ”¬ A comprehensive testing process includes a parameter test to ensure the integrated circuit properties meet specifications.
  • πŸ“Œ Individual die testing uses probe cards with up to 130 needles, precisely aligned to aluminum contact openings.
  • 🎨 Defective ICs are marked with a small colored dot for later elimination.
  • πŸ”„ Both digital and analog circuits are tested, with up to 500 tests required for a typical IC.
  • βš™οΈ The assembly area involves dividing tested wafers into individual dice using a dicing process with diamond-bladed saws.
  • 🧲 Dice are bonded onto copper lead frames using an epoxy resin adhesive, which hardens in a furnace at 145Β°C.
  • πŸ”— Multi-chip assemblies require precise bonding and wire connections, with 276 individual wire connections applied in under 50 seconds.
  • πŸ”¬ Extensive quality inspections and statistical process control are used to maintain process parameters within specification limits.
  • πŸ›‘οΈ Components are molded with a plastic compound containing ultrafine glass particles to protect sensitive wire connections and prevent corrosion.
  • πŸ” Post-molding, components undergo X-ray inspection to ensure the integrity of the gold wires and positioning.
  • 🏷️ Each component is marked with a laser beam, including type, manufacturing date, and batch number for traceability and quality control.

Q & A

  • What is the first test conducted on the silicon wafers in the backend production process?

    -The first test conducted on the silicon wafers is the parameter test, which ensures that the properties of the integrated circuit, such as specific transistor characteristics, comply precisely with the specifications.

  • How are the individual needles of the probe card positioned during testing?

    -The individual needles of the probe card have to be accurately positioned on the aluminium contact openings, which are only about 100 micrometers in size.

  • What is done to mark defective integrated circuits during the testing phase?

    -Defective integrated circuits are marked with a small colored dot on the wafer, which allows for their elimination at a later stage.

  • How many tests are typically necessary to check the digital and analog circuits in a micronus IC?

    -In a typical case, 500 tests are necessary to check the digital and analog circuits in a micronus IC.

  • What is the purpose of the adhesive film used when mounting the wafers in a metal frame?

    -The adhesive film ensures that the dice remain in their original position even after they've been sawn apart and that the wafer can be further processed in a reliable manner.

  • What is the width of the saw blades used in the dicing process?

    -The saw blades used in the dicing process are fitted with minute diamonds and are only 30 micrometers wide.

  • How are the individual dice picked up after the dicing process?

    -The individual dice are picked up by fully automatic machines with an integrated imaging system, which corrects any positioning errors.

  • What is the role of the copper strips in the assembly area?

    -The copper strips, also known as lead frames, form the electric contact with the printed circuit board and are bonded onto the dice with an epoxy resin adhesive.

  • How is the electric contact between the aluminium contact surfaces on the dice and the fingers of the copper lead frame achieved?

    -The electric contact is achieved through a thin gold wire, which is welded on by fully automatic wire bonders at a temperature of 200Β° C with the aid of pressure and ultrasonic energy.

  • What is the purpose of the plasma cleaning operation after the silver conducting adhesive has been hardened?

    -The plasma cleaning operation serves to remove any organic contamination on the contact surfaces of the printed circuit board or the dice.

  • How is the quality of the components ensured during the molding process?

    -Quality is ensured through extensive quality inspections, such as mechanical pull tests and statistical process control, which keeps individual parameters within specification limits.

Outlines

00:00

πŸ” Quality Assurance in Micronus Wafer Fab

The script describes the meticulous quality control processes at Micronus's back-end semiconductor manufacturing facility. Wafers are tested for compliance with specifications using special test equipment and structures. A parameter test is conducted to ensure the integrated circuits' properties meet the required standards. Each die is individually tested using probe cards with precision alignment on tiny contact openings. Defective ICs are marked and later eliminated. The wafers are then divided into individual dice using a dicing process with diamond-coated blades. The dice are picked up by machines with imaging systems to correct any positioning errors. Defective dice are left on the adhesive film, while the rest are bonded onto copper strips for electrical contact with the printed circuit board. The process involves both in-house and purchased memory chips, with a high level of precision and quality control to ensure customer satisfaction.

05:01

πŸ”§ Backend Production Process at Micronus

This paragraph details the backend production process at Micronus, where expert employees and advanced equipment work continuously to ensure quality. After the adhesive is hardened, a plasma cleaning operation removes organic contamination from the contact surfaces. Electric contact is established through gold wire bonding, which is applied by automatic machines at high temperatures and with ultrasonic energy. Quality inspections are conducted, including mechanical tests and statistical process control to maintain parameters within specification limits. Components are molded with a plastic compound under high pressure to protect the wire connections and prevent corrosion. The molding compound is made of a thermoset material with ultrafine glass particles to minimize thermal expansion differences with the silicon dice. The molded components are inspected using an X-ray microscope to confirm the integrity of the gold wires. The copper lead frame's leads are then cut in a stamping process to separate the components.

10:02

πŸ›  Final Processing and Quality Checks at Micronus

The final steps in Micronus's production process involve electrochemically plating the copper lead frame to facilitate further processing by customers. The electroplated leads are then trimmed and shaped before being separated into transport trays. Micronus conducts comprehensive checks to ensure the functionality of both digital and analog circuits at various temperature ranges, simulating real-world operating conditions. Components that fail to meet specifications are scrapped. Each component is marked with a laser beam, indicating type, manufacturing date, and batch number for identification and traceability. Before storage, a complex imaging system checks the leads against package specifications to ensure they are suitable for automated customer processing. The process concludes with a commitment to delivering high-quality soldered joints and components.

Mindmap

Keywords

πŸ’‘Multichip

A multichip refers to an integrated circuit that contains multiple chips or dies on a single substrate. This technology allows for the integration of various functionalities into one compact unit. In the context of the video, multichip production is highlighted as a complex process that involves testing, assembly, and bonding of different types of chips onto a single substrate, showcasing the advanced capabilities of the manufacturing process.

πŸ’‘Parameter Test

The parameter test is a quality control measure used in semiconductor manufacturing to ensure that the properties of the integrated circuits, such as specific transistor characteristics, comply with the design specifications. This test is crucial for monitoring the process parameters employed in the fabrication of wafers. In the video, the parameter test is mentioned as an initial step to ensure the integrity of the integrated circuits before further processing.

πŸ’‘Probe Cards

Probe cards are tools used in the semiconductor industry to make electrical contact with the tiny contact pads on integrated circuits for testing purposes. They contain numerous needles, each of which must be accurately positioned on the aluminum contact openings. The video describes how these cards are used to conduct tests on individual dice on the wafer, highlighting the precision required in the testing process.

πŸ’‘Dicing

Dicing is the process of cutting a wafer into individual dice or chips using a high-precision saw with diamond-coated blades. This process is critical in the backend of semiconductor manufacturing as it separates the wafer into individual units that can be assembled into final products. The video script mentions dicing as a fully automatic process where wafers are cut into individual dice with blades that are only 30 micrometers wide.

πŸ’‘Lead Frame

A lead frame is a metal structure that supports and electrically connects the semiconductor die to the external circuitry. It is used as a base for the die and provides the necessary electrical connections through its leads. In the video, lead frames are mentioned as a key component in the assembly process, where they form the electric contact with the printed circuit board.

πŸ’‘Wire Bonding

Wire bonding is a process used to create electrical connections between the semiconductor die and the lead frame by attaching thin gold wires. This is done using specialized equipment that applies pressure and ultrasonic energy to weld the wires. The video emphasizes the precision and speed of this process, with a multi-chip requiring 276 individual wire connections applied in less than 50 seconds.

πŸ’‘Molding Compound

A molding compound is a plastic material used to encapsulate the semiconductor device, providing protection from mechanical damage and environmental factors such as moisture. The video describes the use of a thermoset molding compound containing ultrafine glass particles to minimize the difference in thermal expansion between the compound and the silicon die, ensuring reliable long-term performance.

πŸ’‘Plasma Cleaning

Plasma cleaning is a process used to remove organic contamination from surfaces, such as the contact surfaces of dice or printed circuit boards. This is an important step in the semiconductor manufacturing process to ensure the quality of electrical connections. The video mentions plasma cleaning as a step that follows the hardening of the silver conducting adhesive, emphasizing the attention to cleanliness in the production process.

πŸ’‘Quality Inspection

Quality inspection is a critical part of the semiconductor manufacturing process, involving various tests and checks to ensure that the components meet the required specifications. The video script describes extensive quality inspections, including mechanical pull tests and statistical process control, to detect and correct any deviations from the set point values, ensuring the components' reliability and performance.

πŸ’‘Coefficient of Thermal Expansion (CTE)

The coefficient of thermal expansion (CTE) is a measure of how much a material expands or contracts with changes in temperature. In the context of the video, the CTE of the molding compound is discussed as an important factor to consider when selecting materials for encapsulating the semiconductor devices. A compound with a CTE that closely matches that of the silicon die helps to prevent mechanical stress and failure due to thermal cycling.

πŸ’‘Laser Marking

Laser marking is a process used to permanently inscribe information onto a component's surface using a laser beam. This is typically used for identification purposes, such as marking the type, date of manufacture, and batch number of a semiconductor component. The video mentions laser marking as the final step before the components are sent to the sales warehouse, ensuring that each component can be precisely identified for quality control and customer service purposes.

Highlights

Micronus uses dust-type boxes for transporting processed silicon wafers from the wafer Fab.

Wafers undergo comprehensive testing with special equipment to ensure circuit properties meet specifications.

Parameter tests are conducted using test structures to monitor process parameters in the wafer Fab.

Individual die testing is done with probe cards containing up to 130 needles for precise electrical contact.

Defective ICs are marked with colored dots for later elimination.

Most micronus ICs require 500 tests, conducted in under three seconds.

Wafers are mounted in metal frames with adhesive film for dicing into individual dice.

Dicing process uses saw blades with minute diamonds, turning at over 30,000 rotations per minute.

Automatic machines with imaging systems pick up dice, correcting any positioning errors.

Defective dice are left on the adhesive film, while others are bonded onto copper strips.

Copper strips form the electric contact with the printed circuit board, also known as lead frames.

Silver conducting adhesive with silver particles is used for bonding and hardened in a furnace.

Multichip assembly involves bonding additional dice onto the printed circuit board with high precision.

Gold wire, only 25 micrometers thick, is used for electric contact between dice and lead frame fingers.

Quality inspections include mechanical tests and statistical process control to maintain parameter limits.

Components are molded with a plastic compound containing ultrafine glass particles to match thermal expansion.

Molding compound quality is critical for long-term reliability of the finished components.

X-ray microscope inspection confirms that molding has not affected the position of gold wires.

Leads of the copper lead frame are electrochemically plated for further processing by customers.

Components are subjected to temperature tests simulating minimum or maximum operating conditions.

Each component is marked with a laser beam containing type, date of manufacture, and batch number.

Final quality check ensures leads correspond precisely to package specifications for automatic customer processing.

Transcripts

play00:02

back end at micronus taking the example

play00:05

of multichip

play00:08

[Music]

play00:18

production the ready processed silicon

play00:21

Wafers are supplied in dust type boxes

play00:23

from the micronus wafer Fab next door

play00:26

all the Wafers are now put through a

play00:28

comprehensive range of tests with the

play00:30

aid of special test

play00:33

equipment first of all the so-called

play00:35

parameter test is conducted this is

play00:37

performed with test structures specially

play00:39

generated for the purpose which are

play00:41

arranged between the actual dice the

play00:43

parameter test makes sure that the

play00:44

properties of the integrated circuit

play00:46

such as specific transistor

play00:47

characteristics comply precisely with

play00:50

the specifications this test thus

play00:52

monitors the process parameters imployed

play00:54

in micron's wafer Fab the next test is

play00:57

conducted on each individual die on the

play00:59

wafer the electrical contacts are made

play01:01

with so-called probe cards which contain

play01:03

up to 130

play01:04

needles the individual needles have to

play01:07

be accurately positioned on the

play01:08

aluminium contact openings which are

play01:10

only about 100 micrometers in size

play01:13

defective ic's are marked with a small

play01:15

colored dot on the wafer and eliminate

play01:17

it at a later stage most micronus ic's

play01:21

contain both digital and analog circuits

play01:23

in a typical case 500 tests are

play01:26

necessary to check these ic's tests that

play01:28

are conducted in less than three

play01:31

[Music]

play01:37

seconds in the assembly area the tested

play01:40

Wafers now have to be divided up into

play01:42

individual

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[Music]

play01:47

dice first of all the Wafers are mounted

play01:49

in a metal frame with the aid of an

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adhesive film only 70 microm

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[Music]

play01:58

thick

play02:01

the film that's clamped in the Metal

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Frames ensures that the dice remain in

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their original position even after

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they've been swn apart and that the

play02:08

wafer can be further processed in a

play02:10

reliable

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[Music]

play02:23

manner the wafer is now aligned fully

play02:25

automatically and cut into individual

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dice with saw blades process also known

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as

play02:33

dicing the S blades are fitted with

play02:35

minute diamonds and are only 30 micromet

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wide they turn at more than 30,000

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rotations per

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minute deionized water is used to cool

play02:47

the sore blade and to remove the Silicon

play02:49

dust that's

play02:50

[Music]

play02:58

created

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[Music]

play03:03

the individual dice are picked up by

play03:05

fully automatic machines with an

play03:06

integrated Imaging system and any

play03:09

positioning errors are

play03:12

corrected the defective dice previously

play03:15

marked with a small colored dot or the

play03:17

defective printed circuit board in the

play03:19

case of multichip assembly are left on

play03:21

the adhesive

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film the remaining dice or in this

play03:24

particular case a small printed circuit

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board are bonded onto copper strips with

play03:28

an epoxy res

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[Music]

play03:33

adhesive these copper strips

play03:35

subsequently form the electric contact

play03:36

with the printed circuit board they're

play03:38

also known by the technical term of lead

play03:41

frames the silver conducting adhesive

play03:44

which is filled with silver particles is

play03:46

hardened for 45 minutes in a continuous

play03:48

furnace operating at 145Β°

play03:51

[Music]

play03:58

C

play04:02

in multichip assembly two further dice

play04:04

are now bonded onto the printed circuit

play04:06

board in a further bonding

play04:12

operation one of the dice comes from the

play04:15

micrones wafer Fab and is processed as a

play04:17

diced wafer in the manner already

play04:20

[Music]

play04:28

described

play04:30

the second die is a memory chip that has

play04:32

been purchased it's been fully tested

play04:35

and is supplied on surf

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[Music]

play04:42

tapes the fully automatic machine

play04:44

employed for this process is able to

play04:46

process both dice at one and the same

play04:48

time and position them with a degree of

play04:50

precision in excess of 25

play04:53

[Music]

play04:58

micromet to ensure the necessary high

play05:01

quality is achieved in the elaborate

play05:03

process steps performed in backend

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production expert employees and state

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of-the-art equipment work Right Round

play05:09

the

play05:10

[Music]

play05:16

Clock after the silver conducting

play05:18

adhesive has been hardened once again

play05:20

during a second run through the furnace

play05:22

a plasma cleaning operation takes place

play05:25

this serves to remove any organic

play05:27

contamination on the contact surfaces of

play05:29

the printed circuit board or the

play05:46

[Music]

play05:51

dice the electric contact between the

play05:53

aluminium contact surfaces on the dice

play05:55

and the fingers of the copper lead frame

play05:57

is achieved through a thin gold wire

play05:59

wire this is welded on by fully

play06:02

automatic wire bonders at a temperature

play06:04

of 200Β° C with the aid of pressure and

play06:07

ultrasonic

play06:19

energy a multi-chip requires 276

play06:22

individual wire connections which are

play06:25

applied in less than 50

play06:28

seconds

play06:30

[Music]

play06:40

[Music]

play07:04

the gold wire which is only 25

play07:07

micrometers thick ensures a perfect

play07:09

electric

play07:27

contact to ensure that any deviations in

play07:30

the process are detected as early on as

play07:32

possible extensive quality inspections

play07:34

are carried out such as this mechanical

play07:36

pool

play07:37

test statistical process control is used

play07:40

to keep the individual parameters within

play07:42

the specification limits on the basis of

play07:44

so-called control charts any deviations

play07:47

from the set point values are detected

play07:49

in this way and can be corrected without

play07:51

delay this guarantees liability which in

play07:54

turn ensures that we meet our customers

play07:56

quality

play07:58

demands

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[Music]

play08:10

to protect the sensitive wire

play08:12

connections from mechanical damage and

play08:13

to prevent the Silicon Dice from

play08:15

corroding through moisture all the

play08:17

components are molded with a plastic

play08:18

compound under high pressure at a

play08:20

temperature of 175Β°

play08:25

C the plastic compound used is a

play08:27

thermoset which contains more than 80%

play08:29

ultrafine glass particles as a filler

play08:32

this ensures that the difference between

play08:34

the coefficient of thermal expansion of

play08:35

the molding compound and the Silicon Dy

play08:38

is kept as small as possible the quality

play08:41

requirements placed on the molding

play08:42

compound in terms of processibility

play08:44

Purity and specified mechanical

play08:46

properties are extremely high they

play08:49

ensure that the finished components will

play08:50

operate reliably over a very long period

play08:52

of

play08:55

[Music]

play08:58

time

play09:00

when the molded component is inspected

play09:01

in an x-ray microscope a highly enlarged

play09:04

shadow image of the Interior is seen

play09:06

this serves to confirm that the molding

play09:08

operation has not changed the position

play09:10

or course of the fine gold

play09:15

[Music]

play09:25

wires after the molding operation the

play09:27

individual leads of the copper lead

play09:29

frame are still all connected to each

play09:33

[Music]

play09:41

other this so-called Dam bar is now cut

play09:44

in a stamping

play09:46

[Music]

play09:58

process

play10:01

[Music]

play10:08

the surface of the copper lead frame

play10:09

that's still bare is now

play10:11

electrochemically plated in The Next

play10:13

Step this ensures that the finished

play10:15

components can then be further processed

play10:17

by the customer without any

play10:20

[Music]

play10:28

problems

play10:33

the electroplated leads now have to be

play10:34

trimmed to the right length and given

play10:36

their final shape in a number of

play10:38

different forming

play10:39

[Music]

play10:43

stages after this the individual

play10:46

components are separated and placed in

play10:48

transport

play10:49

[Music]

play10:58

trays

play11:02

micronus then conducts another full

play11:04

check to ensure that the digital and

play11:06

analog circuits on all the finished

play11:08

components are working perfectly this

play11:10

check is conducted at -45Β° C at ambient

play11:14

temperature and at plus 95Β° C depending

play11:18

on the

play11:19

requirements these values simulate the

play11:21

minimum or maximum operating temperature

play11:23

of the components that can occur in a

play11:25

subsequent application of the

play11:27

customers

play11:30

components that don't comply with all

play11:32

the specified properties such as if

play11:34

electrical parameters have been

play11:36

adversely affected through the molding

play11:37

process are eliminated after this

play11:39

process step and

play11:42

[Music]

play11:57

scrapped

play12:00

[Music]

play12:05

as the final step each component is

play12:07

marked with a laser

play12:10

beam this inscription contains the type

play12:13

date of manufacturer and the batch

play12:15

number it's also used for precise

play12:17

identification in the event of a

play12:19

customer

play12:20

[Music]

play12:27

complaint before the components are

play12:30

taken to the sales Warehouse a check is

play12:32

conducted with a complex Imaging system

play12:34

to ensure that the leads correspond

play12:36

precisely to the package

play12:38

[Music]

play12:44

specification this ensures that our

play12:46

customers can further process the

play12:47

products we deliver by predominantly

play12:50

automatic means and above all it means

play12:52

that the solded joints we Supply are all

play12:57

perfect

play13:08

quality from

play13:11

[Music]

play13:19

micronus

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Related Tags
Microchip ProductionWafer TestingIC AssemblyQuality ControlSemiconductorMicronus FabDicing ProcessWire BondingMolding CompoundAutomated Testing